The Advantest R3753EH is an instrument which measures the complex transmission and reflection characteristics of two-port devices in the frequency domain. It does this by sampling the incident signal, separating the transmitted and reflected waves, and then performing ratios that are directly related to the reflection and transmission coefficients of the two-port. Frequency is swept to rapidly obtain amplitude and phase information over a band of frequencies of interest. The R3753EH utilize synthesized-frequency sources to provide a known test stimulus that can sweep across a range of frequencies or power levels. The R3753EH also can perform ratioed measurements (including phase), which require multiple receivers. The R3753EH can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, and group-delay response.
•7.8-in TFT clr LCD
•Expd BASIC prog mem (1MB)
•Expd save reg cap (2MB)
•Impr BASIC proc speed
•built in programmable controller
•High speed Level Sweep Function