Beschreibung

GenRad 1689 and 1689M Precision Impedance (LCR) Meter (RLC Digibridge). The GenRad 1689 Precision Impedance Meter gives you the best performance for your most demanding applications whether they be production test, incoming inspection, component design and evaluation, process monitoring or dielectric measurement. It is a versatile, full function microprocessor-based passive component tester that’s available in a rack mountable, (1689M) model. The GenRad 1689 Precision Impedance Meter is a sophisticated, microprocessor-controlled tester that brings new levels of flexibility, simplicity and accuracy to impedance measurement. It is a high performance automated tester with a range of programmable test frequencies and test voltages, as well as automatic limit comparison, automatic parameter selection, remote programmability, automatic binning, and automatic zeroing. The 1689M Precision Impedance Meter provides a powerful combination of features designed to maximize productivity in all testing environments.

•Full range keyboard-selectable test speeds: 1689-Variable up to 30 measurements per second with high speed option; 1689M-Variable up to 50 measurements per second with high speed option, complements automatic handling Equipment to maximize throughput.
•2 selectable measurement modes: Continuous and Triggered with averaging available in each ensures measurement flexibility.
•Optional, upgraded, IEEE-488.2 Interface enable remote programming and allow the addition of a component handler to optimize throughput.
•IET Digibridge LabView Driver August 2012 for 1689-9640 ieee interface
•Wide choice of measurement parameters allow you to work with familiar units.
•A full, five-digit LED display for RLC measurements and a four-digit readout for D and Q testing, simultaneously Display both test results for each measurement, automatically.
•Q testing, simultaneously display both test results for each measurement, automatically.
•Guarded Kelvin measurement techniques protect measurement integrity.
•Automatic limit comparison and binning ensure fast, mistake-proof sorting of components.
•Automatic self-test and diagnostic check maintains reliable, error-free operation.
•Automatic Binning Summary capability simplifies reporting of measurement results.