Beschreibung
The Advantest R3753AH is an instrument which measures the complex transmission and reflection characteristics of two port devices in the frequency domain. It does this by sampling the incident signal, separating the transmitted and reflected waves, and then performing ratios that are directly related to the reflection and transmission coefficients of the two port. Frequency is swept to rapidly obtain amplitude and phase information over a band of frequencies of interest. The R3753AH utilize synthesized frequency sources to provide a known test stimulus that can sweep across a range of frequencies or power levels. The R3753AH also can perform rationed measurements (including phase), which require multiple receivers. The R3753AH can provide a wealth of knowledge about a device under test (DUT), including its magnitude, phase, and group delay response.
•7.8-in TFT clr LCD
•Wide Dynamic Range: 115dB
•Expd BASIC prog mem (1MB)
•Expd save reg cap (2MB)
•Impr BASIC proc speed
•Limit line function
•Hi-Speed Level Variation Measurements
•Sweep Time: 0.1ms/pt