Beschreibung
2.6 GS/s Sample Rate to Test High-speed Devices and Subsystem
1 Analog and 2 Digital Output Markers to Produce Complex Mixed Analog and Digital Signals
8 M Point Record Length for Long Signal Playtimes
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2.6 GS/s Sample Rate to Test High-speed Devices and Subsystem
1 Analog and 2 Digital Output Markers to Produce Complex Mixed Analog and Digital Signals
8 M Point Record Length for Long Signal Playtimes
2.6 GS/s Sample Rate to Test High-speed Devices and Subsystem
1 Analog and 2 Digital Output Markers to Produce Complex Mixed Analog and Digital Signals
8 M Point Record Length for Long Signal Playtimes
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